• DocumentCode
    3283814
  • Title

    Surface and Interface Analysis of MgxZn1-xO cubic and hexagonal phases by X-Ray Photoelectron and Rutherford Back Scattering Spectroscopies

  • Author

    Hullavarad, S.S. ; Pugel, D.E. ; Dhar, S. ; Takeuchi, I. ; Venkatesan, T. ; Vispute, R.D.

  • fYear
    2005
  • fDate
    Dec. 7-9, 2005
  • Firstpage
    195
  • Lastpage
    196
  • Keywords
    Alloying; Chemical analysis; Optical films; Optical scattering; Optical sensors; Particle scattering; Radiation detectors; Spectroscopy; X-ray scattering; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1596049
  • Filename
    1596049
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3283814