• DocumentCode
    328387
  • Title

    Pattern classification by geometrical learning of binary neural networks

  • Author

    Chu, C.H. ; Kim, J.H.

  • Author_Institution
    Center for Adv. Comput. Studies, Univ. of Southwestern Louisiana, Lafayette, LA, USA
  • Volume
    1
  • fYear
    1993
  • fDate
    25-29 Oct. 1993
  • Firstpage
    1039
  • Abstract
    This paper considers the use of binary neural networks for pattern classification. An expand-and-truncate learning (ETL) algorithm is used to determine the required number of neurons as well as the connecting weights in a three-layered feedforward network for classifying input patterns. The ETL algorithm is guaranteed to find a network for any binary-to-binary mappings. The ETL algorithm´s performance in pattern classification is tested using a breast cancer database that have been used for benchmarking performance other machine learning methods.
  • Keywords
    feedforward neural nets; learning (artificial intelligence); medical diagnostic computing; pattern classification; binary neural networks; binary-to-binary mappings; breast cancer database; connecting weights; expand-and-truncate learning algorithm; geometrical learning; pattern classification; three-layered feedforward network; Breast cancer; Computer networks; Databases; Hamming distance; Joining processes; Machine learning algorithms; Neural networks; Neurons; Pattern classification; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1993. IJCNN '93-Nagoya. Proceedings of 1993 International Joint Conference on
  • Print_ISBN
    0-7803-1421-2
  • Type

    conf

  • DOI
    10.1109/IJCNN.1993.714090
  • Filename
    714090