DocumentCode :
328387
Title :
Pattern classification by geometrical learning of binary neural networks
Author :
Chu, C.H. ; Kim, J.H.
Author_Institution :
Center for Adv. Comput. Studies, Univ. of Southwestern Louisiana, Lafayette, LA, USA
Volume :
1
fYear :
1993
fDate :
25-29 Oct. 1993
Firstpage :
1039
Abstract :
This paper considers the use of binary neural networks for pattern classification. An expand-and-truncate learning (ETL) algorithm is used to determine the required number of neurons as well as the connecting weights in a three-layered feedforward network for classifying input patterns. The ETL algorithm is guaranteed to find a network for any binary-to-binary mappings. The ETL algorithm´s performance in pattern classification is tested using a breast cancer database that have been used for benchmarking performance other machine learning methods.
Keywords :
feedforward neural nets; learning (artificial intelligence); medical diagnostic computing; pattern classification; binary neural networks; binary-to-binary mappings; breast cancer database; connecting weights; expand-and-truncate learning algorithm; geometrical learning; pattern classification; three-layered feedforward network; Breast cancer; Computer networks; Databases; Hamming distance; Joining processes; Machine learning algorithms; Neural networks; Neurons; Pattern classification; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 1993. IJCNN '93-Nagoya. Proceedings of 1993 International Joint Conference on
Print_ISBN :
0-7803-1421-2
Type :
conf
DOI :
10.1109/IJCNN.1993.714090
Filename :
714090
Link To Document :
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