DocumentCode
328387
Title
Pattern classification by geometrical learning of binary neural networks
Author
Chu, C.H. ; Kim, J.H.
Author_Institution
Center for Adv. Comput. Studies, Univ. of Southwestern Louisiana, Lafayette, LA, USA
Volume
1
fYear
1993
fDate
25-29 Oct. 1993
Firstpage
1039
Abstract
This paper considers the use of binary neural networks for pattern classification. An expand-and-truncate learning (ETL) algorithm is used to determine the required number of neurons as well as the connecting weights in a three-layered feedforward network for classifying input patterns. The ETL algorithm is guaranteed to find a network for any binary-to-binary mappings. The ETL algorithm´s performance in pattern classification is tested using a breast cancer database that have been used for benchmarking performance other machine learning methods.
Keywords
feedforward neural nets; learning (artificial intelligence); medical diagnostic computing; pattern classification; binary neural networks; binary-to-binary mappings; breast cancer database; connecting weights; expand-and-truncate learning algorithm; geometrical learning; pattern classification; three-layered feedforward network; Breast cancer; Computer networks; Databases; Hamming distance; Joining processes; Machine learning algorithms; Neural networks; Neurons; Pattern classification; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1993. IJCNN '93-Nagoya. Proceedings of 1993 International Joint Conference on
Print_ISBN
0-7803-1421-2
Type
conf
DOI
10.1109/IJCNN.1993.714090
Filename
714090
Link To Document