• DocumentCode
    3283923
  • Title

    Identifying redundant path delay faults in sequential circuits

  • Author

    Tekumalla, Ramesh ; Menon, P.R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
  • fYear
    1996
  • fDate
    3-6 Jan 1996
  • Firstpage
    406
  • Lastpage
    411
  • Abstract
    We define a class of faults called redundant path delay faults in sequential circuits, which do not effect circuit delay. A method of identifying redundant path delay faults in the next state logic implemented in a two-level sum-of-products form is presented. The method is extended to circuits with general multi-level realization of the next state logic. Experimental results for MCNC´91 benchmark circuits converted into a restricted factored form are also given
  • Keywords
    delays; fault diagnosis; logic testing; multivalued logic circuits; redundancy; sequential circuits; MCNC´91 benchmark circuits; multi-level realization; next state logic; redundant path delay faults; restricted factored form; sequential circuits; two-level sum-of-products form; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Delay; Fault diagnosis; Logic circuits; Redundancy; Robustness; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1996. Proceedings., Ninth International Conference on
  • Conference_Location
    Bangalore
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-7228-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1996.489643
  • Filename
    489643