DocumentCode :
3284086
Title :
Ge/Cu/Ti Ohmic contacts to n-type GaN
Author :
Mahadik, Nadeemullah ; Rao, Mulpuri V. ; Davydov, Albert V.
fYear :
2005
fDate :
Dec. 7-9, 2005
Firstpage :
223
Lastpage :
224
Keywords :
Annealing; Electric resistance; Gallium nitride; Materials science and technology; Metallization; Ohmic contacts; Oxidation; Temperature; Thermal resistance; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
Type :
conf
DOI :
10.1109/ISDRS.2005.1596064
Filename :
1596064
Link To Document :
بازگشت