• DocumentCode
    3284231
  • Title

    Transport in kinked bi-layer graphene interconnects

  • Author

    Terrés, Bernat ; Borgwardt, Nick ; Dauber, Jan ; Volk, Christian ; Engels, Stephan ; Fringes, Stefan ; Weber, Peter ; Wichmann, Uwe ; Stampfer, Christoph ; Trellenkamp, Stefan

  • Author_Institution
    Inst. of Phys. B, RWTH Aachen Univ., Aachen, Germany
  • fYear
    2011
  • fDate
    20-23 Feb. 2011
  • Firstpage
    996
  • Lastpage
    999
  • Abstract
    We present transport experiments on kinked bi-layer graphene nanoribbon interconnects. The studied devices consist of approximately 80 nm wide and 1 μm long bi-layer graphene nanoribbons with different lateral kink angles. We discuss the ambipolar transport characteristics and we show a systematic dependence of the overall conductance with the kink angle, i.e. with the shape of the etched bi-layer graphene nanoribbon. The measurements can be well described with the self-consistent Boltzmann equation for diffusive transport where the kinked angle appears to have an influence on the effective charge carrier mobility, thus revealing the presence of geometry-dependent ballistic transport effects. These results are crucial for the design and fabrication of future single-layer or bi-layer graphene interconnects in potential all-carbon monolithic systems.
  • Keywords
    Boltzmann equation; carrier mobility; etching; graphene; interconnections; nanostructured materials; all-carbon monolithic system; ambipolar transport characteristics; charge carrier mobility; conductance; diffusive transport; etching; geometry-dependent ballistic transport effect; kinked bilayer graphene nanoribbon interconnects; lateral kink angle; self-consistent Boltzmann equation; systematic dependence; transport experiment; Charge carrier mobility; Charge carrier processes; Conductivity; Current measurement; Fabrication; Integrated circuit interconnections; Substrates; bi-layer graphene; interconnects; transport;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-61284-775-7
  • Type

    conf

  • DOI
    10.1109/NEMS.2011.6017523
  • Filename
    6017523