DocumentCode
3284231
Title
Transport in kinked bi-layer graphene interconnects
Author
Terrés, Bernat ; Borgwardt, Nick ; Dauber, Jan ; Volk, Christian ; Engels, Stephan ; Fringes, Stefan ; Weber, Peter ; Wichmann, Uwe ; Stampfer, Christoph ; Trellenkamp, Stefan
Author_Institution
Inst. of Phys. B, RWTH Aachen Univ., Aachen, Germany
fYear
2011
fDate
20-23 Feb. 2011
Firstpage
996
Lastpage
999
Abstract
We present transport experiments on kinked bi-layer graphene nanoribbon interconnects. The studied devices consist of approximately 80 nm wide and 1 μm long bi-layer graphene nanoribbons with different lateral kink angles. We discuss the ambipolar transport characteristics and we show a systematic dependence of the overall conductance with the kink angle, i.e. with the shape of the etched bi-layer graphene nanoribbon. The measurements can be well described with the self-consistent Boltzmann equation for diffusive transport where the kinked angle appears to have an influence on the effective charge carrier mobility, thus revealing the presence of geometry-dependent ballistic transport effects. These results are crucial for the design and fabrication of future single-layer or bi-layer graphene interconnects in potential all-carbon monolithic systems.
Keywords
Boltzmann equation; carrier mobility; etching; graphene; interconnections; nanostructured materials; all-carbon monolithic system; ambipolar transport characteristics; charge carrier mobility; conductance; diffusive transport; etching; geometry-dependent ballistic transport effect; kinked bilayer graphene nanoribbon interconnects; lateral kink angle; self-consistent Boltzmann equation; systematic dependence; transport experiment; Charge carrier mobility; Charge carrier processes; Conductivity; Current measurement; Fabrication; Integrated circuit interconnections; Substrates; bi-layer graphene; interconnects; transport;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location
Kaohsiung
Print_ISBN
978-1-61284-775-7
Type
conf
DOI
10.1109/NEMS.2011.6017523
Filename
6017523
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