DocumentCode
3284278
Title
Reliability optimization for wide bandgap devices: Recent developments in high-spatial resolution thermal imaging of GaN devices
Author
Kuball, M. ; Uren, M.J. ; Martin, T.
fYear
2005
fDate
Dec. 7-9, 2005
Firstpage
246
Lastpage
247
Keywords
Aluminum gallium nitride; Gallium nitride; HEMTs; High-resolution imaging; Image resolution; MODFETs; Phonons; Photonic band gap; Spatial resolution; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2005 International
Print_ISBN
1-4244-0083-X
Type
conf
DOI
10.1109/ISDRS.2005.1596076
Filename
1596076
Link To Document