DocumentCode
3284449
Title
Effect of pulse plating parameters on electrical contact behaviour of nickel coatings
Author
Benhenda, S. ; Benjemaa, N. ; Bourir, M.
Author_Institution
Dept. de Phys. Atomique et Moleculaire, Rennes I Univ., France
fYear
1993
fDate
27-29 Sep 1993
Firstpage
219
Lastpage
223
Abstract
Pulse plated nickel coatings on copper and copper alloys were investigated in view of their use as underlayer in Au/Ni/Cu or as external protective coatings. Deposition parameters were varied in order to determine their influence on the microstructure and consequently on the electrical contact properties of the electrodeposited Ni films. Roughness and hardness measurements as well as SEM studies were performed on these samples. Smooth and dense coatings were obtained for high pause-to-pulse ratio, 25-75 Hz pulse-plating frequencies and low current density. The contact resistances Rc of the as-deposited samples in approach and insert mode were measured versus load Fc in the range 0.1-10 N. It was found that initial contact resistance follows the power law Rc=KFc -n where n is hardness and coating topography dependent. Moreover, aging samples in daily cyclic atmosphere shows an increase in contact resistance during the test, but ohmic behaviour prevails as verified by the current-voltage characteristics. Finally, the mechanical behaviour investigated by a fretting study shows that the pulse reverse condition improves contact resistance stability
Keywords
ageing; contact resistance; corrosion testing; electrical contacts; electrolysis; electroplated coatings; electroplating; hardness testing; metallic thin films; nickel; protective coatings; surface topography; wear; 25 to 75 Hz; Ni coatings; Ni-Cu; SEM studies; current-voltage characteristics; deposition parameters; electrical contact behaviour; electrodeposited Ni films; external protective coatings; fretting study; hardness measurements; mechanical behaviour; ohmic behaviour; pulse plating parameters; pulse reverse condition; pulse-plating frequencies; roughness measurements; stability; underlayer; Coatings; Contact resistance; Copper alloys; Electrical resistance measurement; Frequency; Gold; Microstructure; Nickel; Performance evaluation; Protection;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 1993., Proceedings of the Thirty-Ninth IEEE Holm Conference on
Conference_Location
Pittsburgh, PA
Print_ISBN
0-7803-1270-8
Type
conf
DOI
10.1109/HOLM.1993.489679
Filename
489679
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