DocumentCode
3284563
Title
High-density IC chip integration with parylene pocket
Author
Chang, Jay Han-Chieh ; Huang, Ray ; Tai, Yu-Chong
Author_Institution
Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA
fYear
2011
fDate
20-23 Feb. 2011
Firstpage
1067
Lastpage
1070
Abstract
We utilize the parylene pocket technology and develop a novel integration scheme that will allow us to connect more than 100 bonding pads on an area less than 5 mm × 5 mm with high efficiency. This packaging technique can also house any IC chip or discrete component and provide electrical connection to it. Here we use squeegee technique to connect each pad on the chip with the bonding pad on the pocket to achieve functionality because the chip that is to be integrated in this section has a very dense array and it is impractical and extremely difficult to connect everything manually. Devices testing are done by testing dummy chip integration and soaking test. Positive results prove that such parylene pocket packaging technique works well.
Keywords
biomedical electronics; integrated circuit bonding; integrated circuit design; integrated circuit packaging; integrated circuit testing; prosthetics; bonding pads; devices testing; discrete component; dummy chip integration; electrical connection; high-density IC chip integration; integration scheme; parylene pocket packaging technique; parylene pocket technology; soaking test; squeegee technique; Bonding; Integrated circuits; Metals; Packaging; Prosthetics; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
Conference_Location
Kaohsiung
Print_ISBN
978-1-61284-775-7
Type
conf
DOI
10.1109/NEMS.2011.6017541
Filename
6017541
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