• DocumentCode
    3284563
  • Title

    High-density IC chip integration with parylene pocket

  • Author

    Chang, Jay Han-Chieh ; Huang, Ray ; Tai, Yu-Chong

  • Author_Institution
    Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2011
  • fDate
    20-23 Feb. 2011
  • Firstpage
    1067
  • Lastpage
    1070
  • Abstract
    We utilize the parylene pocket technology and develop a novel integration scheme that will allow us to connect more than 100 bonding pads on an area less than 5 mm × 5 mm with high efficiency. This packaging technique can also house any IC chip or discrete component and provide electrical connection to it. Here we use squeegee technique to connect each pad on the chip with the bonding pad on the pocket to achieve functionality because the chip that is to be integrated in this section has a very dense array and it is impractical and extremely difficult to connect everything manually. Devices testing are done by testing dummy chip integration and soaking test. Positive results prove that such parylene pocket packaging technique works well.
  • Keywords
    biomedical electronics; integrated circuit bonding; integrated circuit design; integrated circuit packaging; integrated circuit testing; prosthetics; bonding pads; devices testing; discrete component; dummy chip integration; electrical connection; high-density IC chip integration; integration scheme; parylene pocket packaging technique; parylene pocket technology; soaking test; squeegee technique; Bonding; Integrated circuits; Metals; Packaging; Prosthetics; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2011 IEEE International Conference on
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-61284-775-7
  • Type

    conf

  • DOI
    10.1109/NEMS.2011.6017541
  • Filename
    6017541