A W-band integrated silicon-germanium loop-back and front-end transmit-receive switch for Built-in-self-test

Author

Schmid, Robert L. ; Song, Peter ; Coen, Christopher T. ; Ulusoy, Ahmet Cagri ; Cressler, John D.

Author_Institution

Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

fYear

2015

fDate

17-22 May 2015

Firstpage

1

Lastpage

4

Abstract

This paper presents a front-end switch that integrates the ability to provide both loop-back testing and transmit-receive operation. In addition, power detectors are integrated with capacitive couplers to sense the power levels at the transmitter output and the receiver input. The measured results show the power detectors have constant responsivity and can predict the power level within 0.5 dB. These capabilities are added to the front-end switch while maintaining an insertion loss of 2.3-2.5 dB and an isolation of 19.5 dB at 94 GHz.

Keywords

Ge-Si alloys; built-in self test; microwave detectors; microwave switches; transceivers; W-band integrated silicon-germanium loop-back; built-in-self-test; capacitive couplers; frequency 94 GHz; front-end transmit-receive switch; loss 2.3 dB to 2.5 dB; power detectors; Antenna measurements; Detectors; Loss measurement; Power measurement; Receivers; Testing; Transmitters; SPDT; SiGe HBT; W-band; builtin-self-test; loop-back test; reverse saturation; silicon-germanium; switch;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium (IMS), 2015 IEEE MTT-S International

Conference_Location

Phoenix, AZ

Type

conf

DOI

10.1109/MWSYM.2015.7166811

Filename

7166811