CMOS Device Reliability for Emerging Cryogenic Space Electronics Applications

Author

Chen, Tianbing ; Najafizadeh, Laleh ; Zhu, Chendong ; Ahmed, Adnan ; Diestelhorst, Ryan ; Espinel, Gustavo ; Cressler, John D.

fYear

2005

fDate

Dec. 7-9, 2005

Firstpage

328

Lastpage

329

Keywords

Application software; CMOS technology; Circuits; Cryogenics; Degradation; Geometry; Hot carriers; Moon; Space technology; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Device Research Symposium, 2005 International

Print_ISBN

1-4244-0083-X

Type

DOI

10.1109/ISDRS.2005.1596119

Filename

1596119

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