DocumentCode
3285050
Title
Sector error rate estimation of concatenated codes in magnetic recording
Author
Bliss, William G. ; Karabed, Razmik ; Zhang, KaiChi ; Varanasi, Chandra C. ; Ashley, Jonathan
Author_Institution
Infineon Technol. Corp., Santa Cruz, CA, USA
Volume
9
fYear
2001
fDate
2001
Firstpage
2726
Abstract
A statistical simulation method is introduced to estimate the sector error rate (SER) of proposed triply concatenated coding systems for magnetic hard disk drives. The outer code is a standard interleaved Reed-Solomon code. The `middle´ codes are run length limiting codes used to demonstrate the effect of error propagation. The inner code(s) are block codes with 1 or 3 parity check bits. First, a baud rate simulation is used to estimate sufficient statistics to extrapolate ECC performance. Second, a Monte Carlo error event simulator generates error instances which are simply checked for correctability. In all code combinations the apparent SNR gains when considering error (or bit) event rates are considerably lessened or completely lost when considering SER
Keywords
Monte Carlo methods; Reed-Solomon codes; block codes; concatenated codes; digital magnetic recording; disc drives; error correction codes; error statistics; extrapolation; hard discs; interleaved codes; runlength codes; ECC performance; Monte Carlo error event simulator; SNR gains; baud rate simulation; block codes; code combination; concatenated codes; correctability; error instances; error propagation; inner code; interleaved Reed-Solomon code; magnetic hard disk drives; magnetic recording; middle codes; parity check bits; run length limiting codes; sector error rate estimation; statistical simulation method; triply concatenated coding systems; Block codes; Code standards; Concatenated codes; Error analysis; Error correction; Estimation error; Hard disks; Parity check codes; Reed-Solomon codes; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, 2001. ICC 2001. IEEE International Conference on
Conference_Location
Helsinki
Print_ISBN
0-7803-7097-1
Type
conf
DOI
10.1109/ICC.2001.936646
Filename
936646
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