Critical Substrate Bias in Variable Threshold Voltage CMOS (VTCMOS) Scheme with Short Channel Devices

Author

Tamsir P., A. ; Ohtou, T. ; Nagumo, T. ; Hiramoto, T.

fYear

2005

fDate

Dec. 7-9, 2005

Firstpage

362

Lastpage

363

Keywords

Analytical models; Circuits; Degradation; Threshold voltage; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Device Research Symposium, 2005 International

Print_ISBN

1-4244-0083-X

Type

DOI

10.1109/ISDRS.2005.1596136

Filename

1596136

Link To Document