Title :
Critical Substrate Bias in Variable Threshold Voltage CMOS (VTCMOS) Scheme with Short Channel Devices
Author :
Tamsir P., A. ; Ohtou, T. ; Nagumo, T. ; Hiramoto, T.
Keywords :
Analytical models; Circuits; Degradation; Threshold voltage; Voltage control;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1596136
