Title :
CMOS foundry Schottky diode microwave power detector fabrication, Spice modeling, and application
Author :
Jeon, Woochul ; Melngailis, John
Keywords :
Area measurement; CMOS process; Detectors; Electrical resistance measurement; Fabrication; Foundries; SPICE; Schottky diodes; Semiconductor device modeling; Voltage;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1596142