• DocumentCode
    3285376
  • Title

    Design of silicon devices for pass-transistor-logic circuits

  • Author

    Vasefi, Fartash ; Abid, Z.

  • fYear
    2005
  • fDate
    Dec. 7-9, 2005
  • Firstpage
    396
  • Lastpage
    397
  • Keywords
    Circuit simulation; Circuit testing; Degradation; Digital circuits; Doping; Leakage current; MOS devices; MOSFET circuits; Silicon devices; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2005 International
  • Print_ISBN
    1-4244-0083-X
  • Type

    conf

  • DOI
    10.1109/ISDRS.2005.1596153
  • Filename
    1596153