• DocumentCode
    3285478
  • Title

    Measurement of weak light emitted from mechanoluminescence materials using Si photodiode and light concentrator

  • Author

    Bu, Nan ; Ueno, Naohiro ; Xu, Cao-nan ; Fukuda, Osamu

  • Author_Institution
    Meas. Solution Res. Center, Nat. Inst. of Adv. Ind., Sci. & Technol., Tosu, Japan
  • fYear
    2009
  • fDate
    25-28 Oct. 2009
  • Firstpage
    1528
  • Lastpage
    1532
  • Abstract
    Mechanoluminescence (ML) is light emission induced by mechanical deformation. Strain/stress monitoring using ML materials has been developed as a non-destructive method for diagnosis of deterioration in structures; this method is promising and is expected to find broad application in the field of structural health monitoring (SHM). This paper proposes a light measurement system for the weak and diffusive light emitted from ML materials considering applications for crack detection. Si photodiode (PD) is used as the light detector with respect to the cost when dealing with practical applications. In addition, light concentrators are developed in order to (1) increase light beams arriving at the PD surface and (2) enlarge the detecting area of a single PD. In this study, light concentrators are designed using flat reflective surfaces, and the size of concentrators is investigated. In the experiments, increase of PD´s output current was achieved with a light concentrator.
  • Keywords
    condition monitoring; fibre optic sensors; optical variables measurement; photodetectors; photodiodes; silicon; strain sensors; structural engineering; triboluminescence; Si; diffusive light; flat reflective surface; light concentrator; mechanical deformation; mechanoluminescence material; silicon photodiode; strain monitoring; stress monitoring; structural health monitoring; weak light measurement; Capacitive sensors; Costs; Materials science and technology; Monitoring; Photodiodes; Powders; Sensor arrays; Strain measurement; Stress; Surface cracks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2009 IEEE
  • Conference_Location
    Christchurch
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-4548-6
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2009.5398472
  • Filename
    5398472