Mapping nanoscale domain patterns in ferroelectric ceramics by atomic force acoustic microscopy and piezoresponse force microscopy

Author

Li, Faxin ; Zhou, Xilong ; Zeng, Huarong

Author_Institution

Coll. of Eng., Peking Univ. Beijing, Beijing, China

fYear

2012

fDate

9-13 July 2012

Firstpage

1

Lastpage

4

Abstract

In this paper, nanoscale domain patterns of ferroelectric ceramics were investigated by both piezoelectric force microscopy (PFM) and atomic force acoustic microscopy (AFAM) in the same scanning area. The domain patterns imaged by both the single-frequency AFAM and resonance-tracking AFAM are comparable to that by PFM. Meanwhile, using AFAM, the subsurface domain structures can be observed and quantitative nanomechanical mapping of domains was also realized. Finally, we suggest that PFM plus AFAM should be the best choice for characterization of ferroelectric domains.

Keywords

acoustic microscopy; atomic force microscopy; dielectric resonance; electric domains; ferroelectric ceramics; nanomechanics; PFM; atomic force acoustic microscopy; ferroelectric ceramics; ferroelectric domains; nanoscale domain patterns; piezoelectric force microscopy; piezoresponse force microscopy; quantitative nanomechanical mapping; resonance-tracking AFAM; single-frequency AFAM; subsurface domain structure; Atomic force microscopy; Ceramics; Force; Nanoscale devices; Atomic force acoustic microscopy (AFAM); Domain patterns; Ferroelectric ceramics; Piezoresponse force microscopy (PFM);

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp

Conference_Location

Aveiro

Print_ISBN

978-1-4673-2668-1

Type

conf

DOI

10.1109/ISAF.2012.6297746

Filename

6297746