Title :
Fast Transient Power And Noise Estimation For VLSI Circuits
Keywords :
Application specific integrated circuits; CMOS logic circuits; CMOS technology; Circuit noise; Current supplies; Energy consumption; Power system reliability; Semiconductor device modeling; Very large scale integration; Voltage;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629775
