• DocumentCode
    3286077
  • Title

    Development of novel Pb, Li, Na and K-free piezoelectric materials for Si-based MEMS application

  • Author

    Funakubo, Hiroshi ; Yasui, Shintaro ; Yazawa, Keisuke ; Nagata, Junichi ; Oikawa, Takahiro ; Yamada, Tomoaki ; Uchida, Hiroshi

  • Author_Institution
    Dept. of Innovative & Eng. Mater., Tokyo Inst. of Technol., Yokohama, Japan
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We developed the piezoelectric materials not including Pb, Li, K and Na as constituent elements. Our concern is the composition survey of the morphotropic phase boundary between tetragonal and non-tetragonal ferroelectric materials. In this approach, we must select the tetragonal ferroelectrics other than PbTiO3 and (Bi1/2K1/2)TiO3 as a end material. BiCoO3 and Bi(Zn1/2Ti1/2)O3 are novel tetragonal candidates for this purpose. We successfully grew epitaxial tetragonal films having ferroelectricity in BiCoO3-BiFeO3 and Bi(Zn1/2Ti1/2)O3-BiFeO3 systems. Based on these system, composition having maximum piezoelectric response of d33(AFM) = 280 pm/V was discovered for epitaxial films in Bi(Zn1/2Ti1/2)O3-Bi(Mg1/2Ti1/2)O3-BiFeO3 system.
  • Keywords
    bismuth compounds; epitaxial layers; ferroelectric ceramics; ferroelectric thin films; ferroelectricity; liquid phase epitaxial growth; piezoceramics; piezoelectric thin films; piezoelectricity; Bi(Zn0.5Ti0.5)O3-Bi(Mg0.5Ti0.5)O3-BiFeO3; ceramics; epitaxial tetragonal films; ferroelectricity; morphotropic phase boundary; piezoelectric materials; silicon-based MEMS; tetragonal-nontetragonal ferroelectric materials; Epitaxial growth; Lead; Micromechanical devices; Piezoelectric materials; Substrates; K and Na-free; Li; MEMS application; Pb; piezoelectric materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
  • Conference_Location
    Aveiro
  • Print_ISBN
    978-1-4673-2668-1
  • Type

    conf

  • DOI
    10.1109/ISAF.2012.6297769
  • Filename
    6297769