• DocumentCode
    3286305
  • Title

    Optical properties and electronic band structure of topological insulators on A2 5B36 compound based

  • Author

    Koc, Husnu ; Mamedov, Amirullah M. ; Ozbay, Ekmel

  • Author_Institution
    Dept. of Phys., Siirt State Univ., Siirt, Turkey
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We have performed a first principles study of structural, electronic, and optical properties of rhombohedral Sb2Te3 and Bi2Te3 compounds using the density functional theory within the local density approximation. The lattice parameters, bulk modulus, and its pressure derivatives of these compounds have been obtained. The linear photon-energy dependent dielectric functions and some optical properties such as the energy-loss function, the effective number of valance electrons and the effective optical dielectric constant are calculated and presented in the study.
  • Keywords
    ab initio calculations; antimony compounds; bismuth compounds; density functional theory; dielectric function; elastic moduli; elasticity; energy gap; lattice constants; narrow band gap semiconductors; optical constants; permittivity; topological insulators; valence bands; Bi2Te3; Sb2Te3; bulk modulus; density functional theory; effective optical dielectric constant; electronic band structure; electronic properties; energy-loss function; first principles calculation; lattice parameters; linear photon-energy-dependent dielectric function; local density approximation; narrow band gap semiconductors; optical properties; rhombohedral compounds; structural properties; topological insulators; valance electrons; Bismuth; Compounds; Crystals; Dielectrics; Lattices; Photonics; ab initio calculation; electronic structure; optical properties;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
  • Conference_Location
    Aveiro
  • Print_ISBN
    978-1-4673-2668-1
  • Type

    conf

  • DOI
    10.1109/ISAF.2012.6297780
  • Filename
    6297780