• DocumentCode
    3286460
  • Title

    Measurement And Modeling Of MOS Transistor Current Mismatch In Analog IC´s

  • Author

    Felt, Eric ; Narayan, Amit ; Sangiovanni-Vlncentelli, A.

  • fYear
    1994
  • fDate
    6-10 Nov 1994
  • Firstpage
    272
  • Lastpage
    277
  • Keywords
    Analog integrated circuits; Current measurement; Data mining; Electric variables measurement; Integrated circuit modeling; Integrated circuit technology; MOSFETs; Permission; Semiconductor device modeling; Semiconductor process modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1994., IEEE/ACM International Conference on
  • ISSN
    1063-6757
  • Print_ISBN
    0-8186-3010-8
  • Type

    conf

  • DOI
    10.1109/ICCAD.1994.629779
  • Filename
    629779
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3286460