Title :
Local polarization in strontium barium niobate (SBN) epitaxial thin films investigated using Kelvin Force Microscopy (KFM)
Author :
Cuniot-Ponsard, Mireille
Author_Institution :
Lab. Charles Fabry, Univ. Paris Sud, Palaiseau, France
Abstract :
The Kelvin Force Microscopy technique is exploited to obtain quantitative information on the local polarization dependences in strontium barium niobate epitaxial thin films.
Keywords :
barium compounds; dielectric polarisation; epitaxial layers; ferroelectric thin films; strontium compounds; KFM; Kelvin force microscopy; SrxBa1-xNb2O6; ferroelectric relaxor; local dielectric polarization; strontium barium niobate epitaxial thin films; Barium; Electric fields; Epitaxial growth; Force; Kelvin; Microscopy; Strontium; KFM; KPFM; Kelvin Force Microscopy; SBN; epitaxial; remnant polarization; strontium barium niobate; thin films;
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
DOI :
10.1109/ISAF.2012.6297795
