• DocumentCode
    3286557
  • Title

    Local polarization in strontium barium niobate (SBN) epitaxial thin films investigated using Kelvin Force Microscopy (KFM)

  • Author

    Cuniot-Ponsard, Mireille

  • Author_Institution
    Lab. Charles Fabry, Univ. Paris Sud, Palaiseau, France
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The Kelvin Force Microscopy technique is exploited to obtain quantitative information on the local polarization dependences in strontium barium niobate epitaxial thin films.
  • Keywords
    barium compounds; dielectric polarisation; epitaxial layers; ferroelectric thin films; strontium compounds; KFM; Kelvin force microscopy; SrxBa1-xNb2O6; ferroelectric relaxor; local dielectric polarization; strontium barium niobate epitaxial thin films; Barium; Electric fields; Epitaxial growth; Force; Kelvin; Microscopy; Strontium; KFM; KPFM; Kelvin Force Microscopy; SBN; epitaxial; remnant polarization; strontium barium niobate; thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
  • Conference_Location
    Aveiro
  • Print_ISBN
    978-1-4673-2668-1
  • Type

    conf

  • DOI
    10.1109/ISAF.2012.6297795
  • Filename
    6297795