Title :
Process-variation-tolerant Clock Skew Minimization
Author :
Lin, Shen ; Wong, C.K.
Keywords :
Capacitance; Circuits; Clocks; Delay estimation; Manufacturing; Minimization; Pins; Routing; Very large scale integration; Wire;
Conference_Titel :
Computer-Aided Design, 1994., IEEE/ACM International Conference on
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1994.629781
