• DocumentCode
    3286911
  • Title

    Diffusion stability of ultra-sharp field emitters

  • Author

    Eremchenko, D.V. ; Djuzhev, N.A. ; Fedirko, V.A.

  • Author_Institution
    Zelenograd Res. Inst. of Phys. Problems, Moscow, Russia
  • fYear
    1996
  • fDate
    7-12 Jul 1996
  • Firstpage
    39
  • Lastpage
    41
  • Abstract
    The tip blunting dynamic under the self-diffusion for an ellipsoidal emitter is considered. The critical curvature of ultra-sharp field emitter is found as a function of the electric field
  • Keywords
    electron field emission; self-diffusion; critical curvature; diffusion stability; electric field; ellipsoidal emitter; self-diffusion; tip blunting dynamics; ultra-sharp field emitter; Atomic layer deposition; Cathodes; Chemicals; Degradation; Ellipsoids; Equations; Heating; Stability; Surface tension; Vacuum breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    0-7803-3594-5
  • Type

    conf

  • DOI
    10.1109/IVMC.1996.601769
  • Filename
    601769