Title :
Diffusion stability of ultra-sharp field emitters
Author :
Eremchenko, D.V. ; Djuzhev, N.A. ; Fedirko, V.A.
Author_Institution :
Zelenograd Res. Inst. of Phys. Problems, Moscow, Russia
Abstract :
The tip blunting dynamic under the self-diffusion for an ellipsoidal emitter is considered. The critical curvature of ultra-sharp field emitter is found as a function of the electric field
Keywords :
electron field emission; self-diffusion; critical curvature; diffusion stability; electric field; ellipsoidal emitter; self-diffusion; tip blunting dynamics; ultra-sharp field emitter; Atomic layer deposition; Cathodes; Chemicals; Degradation; Ellipsoids; Equations; Heating; Stability; Surface tension; Vacuum breakdown;
Conference_Titel :
Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
Conference_Location :
St. Petersburg
Print_ISBN :
0-7803-3594-5
DOI :
10.1109/IVMC.1996.601769
