A study of parametric yield estimation by uniform design sampling

A novel yield estimation method is proposed based on uniform design sampling method. Compared with conventional statistical methods based on Monte Carlo sampling method, this method needs only few circuit simulations to have a valuable estimation. Furthermore, the algorithm to generate samples by uniform design method is very simple, which greatly reduces computational complexity. A comparison of uniform design sampling method with some popular Monte Carlo based methods is made in this paper to show the efficiency of the new method. Finally, a numerical and a circuit example are presented to demonstrate the advantages of the proposed method.