DocumentCode :
3287218
Title :
Theoretical model of SPM-tip electrostatic field accounting for dead layer and domain wall
Author :
Starkov, Alexander ; Starkov, Ivan
Author_Institution :
Inst. of Refrigeration & Biotechnol., Nat. Res. Univ. of Inf. Technol., Mech. & Opt., St. Petersburg, Russia
fYear :
2012
fDate :
9-13 July 2012
Firstpage :
1
Lastpage :
4
Abstract :
A new theoretical approach for the determination of the electric field distribution in the ferroelectric/dielectric system with the presence of the SPM tip is presented. For the analytical solution of the problem some simplifications are introduced (initial model statement has only a numerical solution). Namely, the smallness of the domain wall thickness in the comparison with a domain size and high value of the ferroelectric dielectric permittivity are used. The developed approach allows us to obtain explicit formulas for the polarization and electric field intensity. The calculation and analysis of the tip capacitance as a function of the distance from the ferroelectric interface demonstrate that the presence of charges at the domain wall results in the difference in obtained values of 30% in comparison with the widely used dielectric model [1].
Keywords :
dielectric polarisation; electric domain walls; ferroelectricity; numerical analysis; permittivity; scanning probe microscopy; SPM-tip electrostatic field accounting; dead layer; dielectric polarization; domain wall thickness; electric field intensity distribution; ferroelectric dielectric permittivity; ferroelectric interface; ferroelectric-dielectric system; numerical solution; tip capacitance; Boundary conditions; Dielectrics; Electric potential; Electrostatics; Mathematical model; Physics; Substrates; SPM tip; dead layer; domain wall; electrostatic field; ferroelectric domain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
Type :
conf
DOI :
10.1109/ISAF.2012.6297837
Filename :
6297837
Link To Document :
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