• DocumentCode
    3287218
  • Title

    Theoretical model of SPM-tip electrostatic field accounting for dead layer and domain wall

  • Author

    Starkov, Alexander ; Starkov, Ivan

  • Author_Institution
    Inst. of Refrigeration & Biotechnol., Nat. Res. Univ. of Inf. Technol., Mech. & Opt., St. Petersburg, Russia
  • fYear
    2012
  • fDate
    9-13 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new theoretical approach for the determination of the electric field distribution in the ferroelectric/dielectric system with the presence of the SPM tip is presented. For the analytical solution of the problem some simplifications are introduced (initial model statement has only a numerical solution). Namely, the smallness of the domain wall thickness in the comparison with a domain size and high value of the ferroelectric dielectric permittivity are used. The developed approach allows us to obtain explicit formulas for the polarization and electric field intensity. The calculation and analysis of the tip capacitance as a function of the distance from the ferroelectric interface demonstrate that the presence of charges at the domain wall results in the difference in obtained values of 30% in comparison with the widely used dielectric model [1].
  • Keywords
    dielectric polarisation; electric domain walls; ferroelectricity; numerical analysis; permittivity; scanning probe microscopy; SPM-tip electrostatic field accounting; dead layer; dielectric polarization; domain wall thickness; electric field intensity distribution; ferroelectric dielectric permittivity; ferroelectric interface; ferroelectric-dielectric system; numerical solution; tip capacitance; Boundary conditions; Dielectrics; Electric potential; Electrostatics; Mathematical model; Physics; Substrates; SPM tip; dead layer; domain wall; electrostatic field; ferroelectric domain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
  • Conference_Location
    Aveiro
  • Print_ISBN
    978-1-4673-2668-1
  • Type

    conf

  • DOI
    10.1109/ISAF.2012.6297837
  • Filename
    6297837