DocumentCode
3287226
Title
The Solving Methods of Storing Data Lost in Testing System at the Power Breaking Off Time
Author
Huixin, Zhang ; Kerui, Wu ; Wenyi, Liu
Author_Institution
Nat. Key Lab. For Electron. Meas. Technol., North Univ. of China, Taiyuan, China
Volume
3
fYear
2009
fDate
15-17 May 2009
Firstpage
675
Lastpage
677
Abstract
This paper summarizes the traditional storing and testing methods in the first place. Brings forward the mostly used memory mode of data mixing edit frame and data separately edit frame. Illuminates the problem of data lost at power off time in each storing method. Then several solving methods aiming at the data losing situation of testing system at the power breaking off time are brought forward. Then analyzes the strongpoint and disadvantage of every method. In actual using process, we may choose the appropriate one according to the using environment and the memory medium. Carrying out the comparing and analyzing to the results of every storing method, the paper finally gives out the using conclusion, offers the consulting information for correlative specialties.
Keywords
information storage; data storage; memory mode; power breaking off time; Centralized control; Circuit testing; Computer buffers; Electronic equipment testing; Flash memory; Frequency; Information technology; Logic; Power supplies; System testing; compare; lose; storage;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Technology and Applications, 2009. IFITA '09. International Forum on
Conference_Location
Chengdu
Print_ISBN
978-0-7695-3600-2
Type
conf
DOI
10.1109/IFITA.2009.20
Filename
5232216
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