• DocumentCode
    3287226
  • Title

    The Solving Methods of Storing Data Lost in Testing System at the Power Breaking Off Time

  • Author

    Huixin, Zhang ; Kerui, Wu ; Wenyi, Liu

  • Author_Institution
    Nat. Key Lab. For Electron. Meas. Technol., North Univ. of China, Taiyuan, China
  • Volume
    3
  • fYear
    2009
  • fDate
    15-17 May 2009
  • Firstpage
    675
  • Lastpage
    677
  • Abstract
    This paper summarizes the traditional storing and testing methods in the first place. Brings forward the mostly used memory mode of data mixing edit frame and data separately edit frame. Illuminates the problem of data lost at power off time in each storing method. Then several solving methods aiming at the data losing situation of testing system at the power breaking off time are brought forward. Then analyzes the strongpoint and disadvantage of every method. In actual using process, we may choose the appropriate one according to the using environment and the memory medium. Carrying out the comparing and analyzing to the results of every storing method, the paper finally gives out the using conclusion, offers the consulting information for correlative specialties.
  • Keywords
    information storage; data storage; memory mode; power breaking off time; Centralized control; Circuit testing; Computer buffers; Electronic equipment testing; Flash memory; Frequency; Information technology; Logic; Power supplies; System testing; compare; lose; storage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology and Applications, 2009. IFITA '09. International Forum on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-0-7695-3600-2
  • Type

    conf

  • DOI
    10.1109/IFITA.2009.20
  • Filename
    5232216