• DocumentCode
    3287263
  • Title

    Eigenbench: A simple exploration tool for orthogonal TM characteristics

  • Author

    Hong, Sungpack ; Oguntebi, Tayo ; Casper, Jared ; Bronson, Nathan ; Kozyrakis, Christos ; Olukotun, Kunle

  • fYear
    2010
  • fDate
    2-4 Dec. 2010
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    There are a significant number of Transactional Memory(TM) proposals, varying in almost all aspects of the design space. Although several transactional benchmarks have been suggested, a simple, yet thorough, evaluation framework is still needed to completely characterize a TM system and allow for comparison among the various proposals. Unfortunately, TM system evaluation is difficult because the application characteristics which affect performance are often difficult to isolate from each other. We propose a set of orthogonal application characteristics that form a basis for transactional behavior and are useful in fully understanding the performance of a TM system. In this paper, we present EigenBench, a lightweight yet powerful microbenchmark for fully evaluating a transactional memory system. We show that EigenBench is useful for thoroughly exploring the orthogonal space of TM application characteristics. Because of its flexibility, our microbenchmark is also capable of reproducing a representative set of TM performance pathologies. In this paper, we use Eigenbench to evaluate two well-known TM systems and provide significant insight about their strengths and weaknesses. We also demonstrate how EigenBench can be used to mimic the evaluation coverage of a popular TM benchmark suite called STAMP.
  • Keywords
    benchmark testing; storage management; transaction processing; EigenBench; STAMP; TM system evaluation; evaluation framework; exploration tool; microbenchmark; orthogonal TM characteristic; transactional behavior; transactional benchmark; transactional memory; Benchmark testing; Concurrent computing; Equations; History; Indexes; Pathology; Pollution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Workload Characterization (IISWC), 2010 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-9297-8
  • Electronic_ISBN
    978-1-4244-9296-1
  • Type

    conf

  • DOI
    10.1109/IISWC.2010.5648812
  • Filename
    5648812