DocumentCode
3287283
Title
The Quality of Ocular Artifacts Suppression in Electroencephalogram Depending on Selection of a Wavelet Mother Function for a Signal Decomposition
Author
Larina, Yegenia N. ; Pudov, Vladimir S. ; Polubinsky, Vladimir L.
Author_Institution
Novosibirsk State Tech. Univ, Novosibirsk
fYear
2006
fDate
26-28 Sept. 2006
Firstpage
119
Lastpage
119
Abstract
The traditional method of the suppression of ocular artifacts is a cutting off the contaminated periods of EEG. The drawback of such a technique is a significant loss of the diagnostic information. The method of ocular artifact suppression in EEG, based on wavelet analysis, is investigated in this study. However different groups are proposing various combinations of wavelet mother functions, thresholds and so on, and each group achieves good results by their own method. Here we compare the efficiency of using different wavelet mother functions in the procedure of ocular artifacts suppression. By co-ordination of results in different estimation ways (some of them are cross-correlation, kurtosis and relative entropy by Shannon) we could conclude about efficiency of different wavelet basises and consistent of proposed ways of estimation. Results of investigation can be used as practical recommendations in developing of EEG de-noising algorithms.
Keywords
electroencephalography; entropy; medical signal processing; signal denoising; signal restoration; wavelet transforms; EEG denoising algorithms; Shannon entropy; cross-correlation; diagnostic information loss; electroencephalogram; kurtosis; ocular artifacts suppression; relative entropy; signal decomposition; wavelet analysis; wavelet mother function; Distortion; Electroencephalography; Engineering in Medicine and Biology Society; Entropy; Medical signal detection; Noise reduction; Signal processing algorithms; Signal resolution; Signal restoration; Wavelet analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location
Novosibirsk
Print_ISBN
5-7782-0662-3
Type
conf
DOI
10.1109/APEIE.2006.4292391
Filename
4292391
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