Title :
Impedance and pyroelectric measurements on charge imbalanced BLSF sol-gel ceramic
Author :
Reddy, N. Thirumal ; Prasad, N.V. ; Kumar, G.S. ; Prasad, G. ; Ramana, E. Venkata
Author_Institution :
Dept. of Phys., Osmania Univ., Hyderabad, India
Abstract :
Defect-related structure is often interpreted as a special kind of material in the literature, considering in this direction, oxygen-deficient and charge-imbalanced polycrystalline materials of three-layered compound, namely Sr2Bi2Nb3O12 (SBN), was synthesized by Sol-Gel method. Dielectric and complex impedance analysis was studied on SBN. The enhancement of polarization is attributed to NbO6 octahedra. The sharp intensity-peak observed in Raman spectra is an indicative of Sr-O-Sr and Sr-O-Bi bonds and its competitive interactions. The peaks of FTIR spectra appeared at 610 cm-1 confirmed the same. Electrical impedance and Pyroelectric measurements were also performed. The observed broad semicircle in the complex impedance plot, associated with grain and grain boundary, is corroborated with the log-log spectroscopic plots for better understanding of the disorder ferroelectric behavior of th sample.
Keywords :
Fourier transform spectra; Raman spectra; bismuth compounds; dielectric polarisation; electric impedance; ferroelectric ceramics; grain boundaries; infrared spectra; pyroelectricity; sol-gel processing; strontium compounds; FTIR; Fourier transform infrared spectra; Raman spectra; Sr2Bi2Nb3O12; charge imbalanced bismuth layered structure ferroelectric materials; complex impedance analysis; defect-related structure; dielectric polarization; dielectric properties; disorder ferroelectric behavior; electrical impedance measurements; grain boundary; log-log spectroscopic plots; pyroelectric measurements; sol-gel ceramics; Bismuth; Dielectric measurements; Dielectrics; Frequency measurement; Impedance; Materials; Temperature measurement; BLSF; Raman and FTIR spectra; impedance; pyroelectric;
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
DOI :
10.1109/ISAF.2012.6297848