Title :
The electron energy distribution from very sharp field emitters
Author :
Forbes, Richard G.
Author_Institution :
Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
Abstract :
Controversy exists about the electron energy distribution from a very sharp tungsten field emitter that ends in a single atom. It has been proposed that observation of a double-peaked energy distribution proves that field emission is taking place through a single atom on the top of a so-called teton tip. It is suggested here that this observation is not conclusive, because the present author has observed similar distributions when performing field electron energy analysis on gallium phosphide emitters that were not specially sharpened
Keywords :
electron field emission; GaP; W; electron energy distribution; gallium phosphide; single atom; teton tip; tungsten; very sharp field emitter; Atomic layer deposition; Atomic measurements; Electron emission; Fabrication; Gallium compounds; Microscopy; Milling; Performance analysis; Probes; Tungsten;
Conference_Titel :
Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
Conference_Location :
St. Petersburg
Print_ISBN :
0-7803-3594-5
DOI :
10.1109/IVMC.1996.601773
