DocumentCode
3287455
Title
The electron energy distribution from very sharp field emitters
Author
Forbes, Richard G.
Author_Institution
Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
fYear
1996
fDate
7-12 Jul 1996
Firstpage
58
Lastpage
61
Abstract
Controversy exists about the electron energy distribution from a very sharp tungsten field emitter that ends in a single atom. It has been proposed that observation of a double-peaked energy distribution proves that field emission is taking place through a single atom on the top of a so-called teton tip. It is suggested here that this observation is not conclusive, because the present author has observed similar distributions when performing field electron energy analysis on gallium phosphide emitters that were not specially sharpened
Keywords
electron field emission; GaP; W; electron energy distribution; gallium phosphide; single atom; teton tip; tungsten; very sharp field emitter; Atomic layer deposition; Atomic measurements; Electron emission; Fabrication; Gallium compounds; Microscopy; Milling; Performance analysis; Probes; Tungsten;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1996. IVMC'96., 9th International
Conference_Location
St. Petersburg
Print_ISBN
0-7803-3594-5
Type
conf
DOI
10.1109/IVMC.1996.601773
Filename
601773
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