DocumentCode :
3287543
Title :
Influence of MoO3 on electrical and microstructural properties of (K0.44Na0.52Li0.04)(Nb0.86Ta0.10Sb0.04)O3
Author :
Ramajo, L. ; Castro, M. ; Ávila, H. ; Garcia, Christophe ; Rubio-Marcos, F. ; Fernandez-Lozano, J.
Author_Institution :
Inst. of Res. in Mater. Sci. & Technol. (INTEMA), Mar del Plata, Argentina
fYear :
2012
fDate :
9-13 July 2012
Firstpage :
1
Lastpage :
4
Abstract :
Microstructure, piezoelectric properties and dielectric behavior of undoped and MoO3-doped lead-free (K0.44Na0.52Li0.04)(Nb0.86-xTa0.10-xSb0.04-x)Mo5/6xO3 (KNL-NTS) was investigated. Samples were obtained by the conventional solid state reaction. X-ray diffraction (XRD) and Raman spectra revealed the formation of a perovskite phase, together with some minor secondary phase which could be assigned by XRD to K3LiNb6O17. XRD also showed that the perovskite evolved from a tetragonal to orthorhombic symmetry with the increasing of doping amount. This behavior was not observed with the increasing in the sintering time. The temperature dependence on real permittivity (ε´) revealed the presence of a diffuse phase transition. This behavior was increased with MoO3 concentration. Also, dielectric relaxation processes were observed at room temperature and were dependent on doping level and sintering time.
Keywords :
Raman spectra; X-ray diffraction; antimony compounds; crystal microstructure; crystal structure; dielectric relaxation; doping profiles; lithium compounds; niobium compounds; permittivity; piezoceramics; piezoelectricity; potassium compounds; sintering; sodium compounds; solid-state phase transformations; tantalum compounds; (K0.44Na0.52Li0.04)(Nb0.86-xTa0.10-xSb0.04-x)Mo0.83xO3; Raman spectra; X-ray diffraction; XRD; conventional solid Influence state reaction; crystal structure; dielectric properties; dielectric relaxation processes; diffuse phase transition; doping level; electrical properties; lead titanate-zirconate piezoceramics; microstructural properties; permittivity; perovskite phase formation; piezoelectric properties; sintering time; temperature 293 K to 298 K; tetragonal-orthorhombic symmetry phase transformation; Ceramics; Dielectrics; Doping; Lead; Microstructure; Permittivity; X-ray scattering; KNL-NTS; Lead-free; piezoelectric ceramics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics held jointly with 2012 European Conference on the Applications of Polar Dielectrics and 2012 International Symp Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials (ISAF/ECAPD/PFM), 2012 Intl Symp
Conference_Location :
Aveiro
Print_ISBN :
978-1-4673-2668-1
Type :
conf
DOI :
10.1109/ISAF.2012.6297856
Filename :
6297856
Link To Document :
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