• DocumentCode
    3287717
  • Title

    Eye prediction of digital driver with power distribution network noise

  • Author

    Chiu-Chih Chou ; Hao-Hsiang Chuang ; Tzong-Lin Wu ; Shih-Hung Weng ; Chung-kuan Cheng

  • Author_Institution
    Grad. Inst. of Commun. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2012
  • fDate
    21-24 Oct. 2012
  • Firstpage
    131
  • Lastpage
    134
  • Abstract
    Algorithms featuring fast and accurate estimation of worst-case eye diagram have been proposed to replace the time-consuming random bit simulation in channel design. However, when the interaction between nonlinear I/O circuits and power distribution network (PDN) noise is included, most of those approaches fail to maintain accuracy. Based on the superposition of multiple bit pattern responses (SMBP) concept, Ren and Oh [1] developed an algorithm to fast predict the eye diagram that theoretically captures any nonlinearity in the circuit. In this paper, a test circuit with PDN was constructed to examine the performance of this algorithm. The experiment results show good agreement with the results simulated by long PRBS in HSPICE.
  • Keywords
    circuit noise; circuit testing; driver circuits; HSPICE simulation; PDN; PRBS; SMBP; channel design; circuit testing; digital driver; eye prediction; nonlinear I-O circuit; nonlinearity circuit; power distribution network noise; superposition of multiple bit pattern response; time-consuming random bit simulation; worst-case eye diagram estimation; Accuracy; Algorithm design and analysis; Estimation; Integrated circuit modeling; Power systems; Prediction algorithms; RLC circuits; eye diagram; multiple bit pattern response; nonlinear effect; power distribution network; worst case estimation algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
  • Conference_Location
    Tempe, AZ
  • Print_ISBN
    978-1-4673-2539-4
  • Electronic_ISBN
    978-1-4673-2537-0
  • Type

    conf

  • DOI
    10.1109/EPEPS.2012.6457859
  • Filename
    6457859