• DocumentCode
    3287778
  • Title

    Device SEE susceptibility from heavy ions (1995-1996)

  • Author

    Nichols, D.K. ; Coss, J.R. ; Miyahira, T.F. ; Schwartz, H.R. ; Swift, G.M. ; Koga, R. ; Crain, W.R. ; Crawford, K.B. ; Penzin, S.H.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    1997
  • fDate
    35635
  • Firstpage
    1
  • Lastpage
    13
  • Abstract
    A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs
  • Keywords
    integrated circuit testing; ion beam effects; IC functional classes; IEEE publications; device SEE susceptibility; heavy ions; latchup response; single event effects; test data set; Aerospace testing; Conferences; IEEE publications; Ion beams; Laboratories; Manufacturing processes; Propulsion; Pulp manufacturing; Space technology; Test facilities;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1997 IEEE
  • Conference_Location
    Snowmass Village, CO
  • Print_ISBN
    0-7803-4061-2
  • Type

    conf

  • DOI
    10.1109/REDW.1997.629790
  • Filename
    629790
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3287778