DocumentCode :
3287951
Title :
Simulation on total current density of CIGS solar cell with polysilicon contact window
Author :
Manut, Azrif ; Halim Affendi, I.H. ; Yahya, R. ; Zolkapli, Maizatul
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. MARA, Shah Alam, Malaysia
fYear :
2013
fDate :
22-25 Sept. 2013
Firstpage :
154
Lastpage :
159
Abstract :
CIGS (Copper (Cu), Indium (In), Galium Ga), Diselenide (Se2)) solar cell is the developing technology because of its low cost production and reliability of CIGS semiconductor itself. In this paper the difference of total current density and the IV curve of the CIGS solar cell will be shown when polysilicon was used as a contact window to replace aluminum doped zinc oxide (ZnO;Al) and the thickness of molybdenum and CIGS varied. The thickness of CIGS is varied to get the best thickness in order to obtain a good total current density since polysilicon is not widely used as an electrode in solar cell. Current density of CIGS solar cell will be shown in the figures at the result section.
Keywords :
copper; gallium; indium; molybdenum; reliability; solar cells; CIGS semiconductor reliability; CIGS solar cell; Copper; Galium; Indium; diselenide solar cell; molybdenum thickness; polysilicon contact window; Current density; Electrodes; Industrial electronics; Photovoltaic cells; Silicon; Zinc oxide; CIGS solar cell; polysilicon; thickness; total current density;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications (ISIEA), 2013 IEEE Symposium on
Conference_Location :
Kuching
Print_ISBN :
978-1-4799-1124-0
Type :
conf
DOI :
10.1109/ISIEA.2013.6738986
Filename :
6738986
Link To Document :
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