Title :
Improved procedure to test causality of tabulated S-parameters
Author :
Lalgudi, Subramanian ; Asgari, Shadnaz ; Tsuk, M.
Author_Institution :
ANSYS Inc., Burlington, MA, USA
Abstract :
Tabulated S-parameters are often tested for causality to ensure successful transient simulation. Existing approaches for this test either are not robust or have limited resolution in detecting noncausality. In this paper, a new approach for this test is proposed. The proposed approach is more robust and has better resolution than existing approaches.
Keywords :
S-parameters; causality; circuit testing; frequency response; transient analysis; tabulated S-parameters; test causality; transient simulation; Frequency response; Function approximation; Interpolation; Polynomials; Scattering parameters; Splines (mathematics);
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457874
