Title :
Analysis of Kinetic Phenomenon in Polysilicon (Part 1)
Keywords :
Analytical models; Charge carriers; Electrical resistance measurement; Immune system; Kinetic theory; Magnetic field measurement; Magnetic sensors; Particle scattering; Silicon; Surface resistance;
Conference_Titel :
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
5-7782-0662-3
DOI :
10.1109/APEIE.2006.4292439
