Title :
Simulation-based design of high dimensional electromagnetic systems
Author :
Wei Cui ; Sathanur, Arun V. ; Jandhyala, Vikram
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
Abstract :
Full-wave simulation and design of interconnect systems is becoming increasingly important in view of the continuing trend towards miniaturization and dense integration of components in electronic systems. While full-wave simulation methods have advanced rapidly over the last decade, there is a growing need for superior automated design tools. In this paper we first motivate the need for better design space exploration in high dimensions and outline the key ingredients that are imperative for the development of a successful simulation-based automated design tool. In this direction we describe the application of Orthogonal Arrays as an efficient sampling scheme and the Gaussian Process Regression as a promising model generation scheme for high dimensional design space exploration. We also describe an adaptive strategy for the model refinement and illustrate the same with a full-wave multi-conductor transmission line example. Finally we conclude by outlining the open problems and research challenges in this direction.
Keywords :
Gaussian processes; interconnections; multiconductor transmission lines; regression analysis; Gaussian process regression; design space exploration; full-wave multiconductor transmission line; full-wave simulation; high dimensional electromagnetic systems; interconnect systems; orthogonal arrays; sampling scheme; Adaptation models; Computational modeling; Covariance matrix; Gaussian processes; Ground penetrating radar; Linear programming; Scattering parameters; EDA; Electromagnetic simulation; Field solver; Full-Wave; Gaussian Process; High Dimensional Optimization; Orthogonal Arrays; Polynomial Interpolation; Regression;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2012 IEEE 21st Conference on
Conference_Location :
Tempe, AZ
Print_ISBN :
978-1-4673-2539-4
Electronic_ISBN :
978-1-4673-2537-0
DOI :
10.1109/EPEPS.2012.6457876