Title :
Influence of Testing Signal Amplitude on Accuracy to Measure of the Charge Carrier Concentration Sharp Profiles in Two Harmonic Method
Author :
Velichko, A.A. ; Kornilovich, A.A. ; Uvarov, Eugenie I
Keywords :
Charge carriers; Charge measurement; Current measurement; Electron beams; P-n junctions; Problem-solving; Signal synthesis; Testing; Tree graphs; Voltage;
Conference_Titel :
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location :
Novosibirsk, Russia
Print_ISBN :
5-7782-0662-3
DOI :
10.1109/APEIE.2006.4292446
