DocumentCode
3288242
Title
Digest of Papers. 1992 IEEE VLSI Test Symposium. 10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip (Cat. No.92TH0437-4)
fYear
1992
fDate
7-9 April 1992
Abstract
Presents the cover from the proceedings of this conference.
Keywords
VLSI; automatic testing; boundary scan testing; built-in self test; integrated circuit testing; logic design; logic testing; IDDQ testing; boundary scan; built-in self-test; delay testing; design for testability; design verification; error checking; fault modeling; mixed-signal testing; test generation; yield;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-7803-0623-6
Type
conf
DOI
10.1109/VTEST.1992.232708
Filename
232708
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