Title :
Generalization of independent faults for transition faults
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Abstract :
Independent faults were shown to he effective in computing small test sets for stuck-at faults. An efficient procedure for computing a maximal set of independent stuck-at faults is proposed. The notion of independent faults is then extended to other fault models, specifically, transition faults, that require two-pattern tests. Experimental results are presented to show that the computation of independent faults can be practically performed.<>
Keywords :
fault location; integrated logic circuits; logic testing; fault models; independent faults; maximal set; stuck-at faults; test sets; transition faults; two-pattern tests; Circuit faults; Circuit testing; Cities and towns; Contracts; Delay; FETs; Polynomials; Semiconductor device modeling; System testing; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232716
