• DocumentCode
    3288472
  • Title

    Thin-film thermo-resistor radiation hardness experimental results

  • Author

    Nikiforov, Alexander Y. ; Telets, Vitally A. ; Figurov, Valerie S.

  • Author_Institution
    Specialized Electron. Syst., Moscow, Russia
  • fYear
    1997
  • fDate
    35635
  • Firstpage
    41
  • Lastpage
    43
  • Abstract
    Radiation hardness tests of thin-film thermo-resistors were carried out in the temperature range of -60...+125°C with 1% accuracy. The total resistance deviations from initial values did not exceed 2% after the dose rate 2.7·1010 rad(Si)/s, total dose 1.8·105 rad(Si)/s and neutron flux 2.4·1012 n/cm2 irradiation
  • Keywords
    X-ray effects; electric sensing devices; electron beam effects; electron device testing; gamma-ray effects; neutron effects; radiation hardening (electronics); temperature sensors; thermistors; thin film resistors; -60 to 120 C; NiMo-V; V; radiation hardness tests; thin-film thermo-resistors; Conductors; Dosimetry; Electrical resistance measurement; Error correction; Temperature control; Temperature dependence; Temperature distribution; Temperature measurement; Testing; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 1997 IEEE
  • Conference_Location
    Snowmass Village, CO
  • Print_ISBN
    0-7803-4061-2
  • Type

    conf

  • DOI
    10.1109/REDW.1997.629795
  • Filename
    629795
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3288472