Title :
A functional BIST approach for FIR digital filters
Author :
Counil, C. ; Cambon, G.
Author_Institution :
Montpellier Univ., France
Abstract :
Presents a functional level built-in self-test of digital filters. This BIST technique is based on predetermined patterns which are not dependent on the filter implementation. Many examples show that stuck-at fault coverage is about 98%.<>
Keywords :
built-in self test; digital filters; fault location; FIR digital filters; filter implementation; functional BIST approach; functional level; predetermined patterns; stuck-at fault coverage; Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit testing; Digital filters; Finite impulse response filter; Impulse testing; Registers; Robots; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232730
