DocumentCode
3288537
Title
On-line testing of switched-capacitor filters
Author
Huertas, José L. ; Vázquez, Diego ; Rueda, Adoración
Author_Institution
Dept. de Diseno Analogico, Sevilla Univ., Spain
fYear
1992
fDate
7-9 April 1992
Firstpage
102
Lastpage
106
Abstract
Proposes a new solution to alleviate the area overhead when replication is used in switched-capacitor filters. This new approach, although based on the voter mechanism, only requires a programmable biquad and some control logic as extra components (instead of the full duplication of the system). To some extent, it can be considered a first intent to apply information redundancy for the concurrent test of analog circuits.<>
Keywords
active filters; design for testability; redundancy; switched capacitor filters; area overhead; concurrent test; control logic; information redundancy; programmable biquad; replication; switched-capacitor filters; Analog circuits; Band pass filters; Circuit testing; Communication switching; Control systems; Flexible printed circuits; Programmable control; Redundancy; Signal processing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-7803-0623-6
Type
conf
DOI
10.1109/VTEST.1992.232732
Filename
232732
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