Title :
Out-of plane displacement reconstruction of Carrier-wave Electronic Speckle Pattern Interferometry based on sub-pixel and Fourier transform
Author :
Zhenheng, Lin ; Haihe, Xie ; Jiao, Dai ; Cunmiao, Sun ; Xizhao, Lu
Author_Institution :
Dept. of Electron. & Inf. Eng., Putian Coll. e Putian, Putian, China
Abstract :
Modern scientific research requires higher measurement accuracy on Carrier-wave Electronic Speckle Pattern Interferometry (CESPI). It is expensive to improve measurement accuracy by improving hardware resolution. So a new out-of displacement reconstruction method of CESPI was proposed in this article. Firstly, it adopts grayscale interpolation algorithms to retreat the carrier correlation fringe figures. After the sub-pixel re-sampling processing, the fringe figures will be enlarged. Then using Fourier transform phase demodulation, homomorphic filter, phase calculation operation and displacement reconstruction, three-dimensional displacement figures with sub-pixel will be reconstructed and the corresponding measuring results will be acquired. The method is a global reconstruction method which could obtain higher precision and full court out-of plane displacement information. The experiment result shows that the method has some advantages including simple, reliable, low cost and high precision.
Keywords :
Fourier transform optics; demodulation; electronic speckle pattern interferometry; image reconstruction; interpolation; Fourier transform phase demodulation; carrier wave electronic speckle pattern interferometry; fringe figures; homomorphic filter; image grayscale interpolation algorithm; out-of plane displacement reconstruction; phase calculation operation; subpixel resampling processing; Correlation; Demodulation; Fourier transforms; Image reconstruction; Interpolation; Pixel; Speckle; CESPI; Fourier transform; grayscale interpolation; sub-pixel;
Conference_Titel :
Electric Information and Control Engineering (ICEICE), 2011 International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-8036-4
DOI :
10.1109/ICEICE.2011.5778052