• DocumentCode
    3288654
  • Title

    Empirical bounds on fault coverage loss due to LFSR aliasing

  • Author

    Debany, Warren H. ; Gorniak, Mark J. ; Daskiewich, Daniel E. ; Macera, Anthony R. ; Kwiat, Kevin A. ; Dussault, Heather B.

  • Author_Institution
    Rome Lab., RL/ERDA, Griffiss AFB, NY, USA
  • fYear
    1992
  • fDate
    7-9 April 1992
  • Firstpage
    143
  • Lastpage
    148
  • Abstract
    Linear-feedback shift registers (LFSRs) are often used to compact test responses. Prior analyses, based on statistically-independent error models, have predicted that aliasing probability ´converges´ to 2/sup -k/ for LFSR polynomials of degree k, and that primitive polynomials perform better than nonprimitive polynomials. This paper presents the first statistical results based on full fault simulation that confirm these predictions. However, the average aliasing probability is not by itself a useful measure of the loss of fault detection information; the authors introduce an upper confidence limit (UCL) for the loss of fault coverage. The ´ideal´ UCL is shown to match closely the empirically-derived UCL.<>
  • Keywords
    built-in self test; fault location; logic testing; polynomials; sequential circuits; shift registers; LFSR aliasing; aliasing probability; fault coverage loss; nonprimitive polynomials; primitive polynomials; test responses; upper confidence limit; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Laboratories; Logic circuits; Phase frequency detector; Polynomials; Probability; Shift registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-7803-0623-6
  • Type

    conf

  • DOI
    10.1109/VTEST.1992.232739
  • Filename
    232739