DocumentCode
3288819
Title
Partner SRLs for improved shift register diagnostics
Author
Schafer, James L. ; Policastri, Fred A. ; McNulty, Richard J.
Author_Institution
IBM, Hopewell Junction, NY, USA
fYear
1992
fDate
7-9 April 1992
Firstpage
198
Lastpage
201
Abstract
In LSSD devices, one of the biggest problems encountered today is diagnosing a defective shift register (SR) down to a shift register latch (SRL) boundary. This paper describes a SR configuration that will solve this problem with relatively low overhead.<>
Keywords
logic testing; sequential circuits; shift registers; LSSD devices; SRL boundary; overhead; shift register diagnostics; shift register latch; Clocks; Fault diagnosis; Joining processes; Logic devices; Logic testing; Observability; Shift registers; Strontium; System testing; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-7803-0623-6
Type
conf
DOI
10.1109/VTEST.1992.232749
Filename
232749
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