Title :
The roles of controllability and observability in design for test
Author :
Butler, Kenneth M. ; Kapur, Rohit ; Mercer, M. Ray ; Ross, Doli E.
Author_Institution :
Texas Instruments, Dallas, TX, USA
Abstract :
The nature of many problems related to testability requires detailed information about their underlying test parameters. These parameters are commonly referred to as controllability and observability. This research concerns exact measures of detectability, controllability, and observability to measure the relative importance of the latter two on the likelihood of the former. New functional methods for fault analysis are utilized which allow computations not previously possible; the empirical results presented here are an example of such an application.<>
Keywords :
combinatorial circuits; controllability; design for testability; fault location; logic testing; observability; controllability; design for test; detectability; fault analysis; observability; test parameters; Circuit analysis computing; Circuit faults; Circuit testing; Combinational circuits; Controllability; Costs; Fault detection; Observability; Size measurement; Statistical analysis;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232754
