DocumentCode
3288852
Title
Phase Interactions in the Measurement Assurance of Nanoelectronic Objects
Author
Zhilin, N.S. ; Maistrenko, Vasilii A. ; Nikonov, A.V. ; Nikonova, Galina V. ; Saifutdinov, C.R.
fYear
2006
fDate
26-28 Sept. 2006
Firstpage
273
Lastpage
273
Keywords
Connectors; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Frequency measurement; Permittivity measurement; Phase measurement; Temperature distribution; UHF measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Instrument Engineering, 2006. APEIE '06. 8th International Conference on Actual Problems of
Conference_Location
Novosibirsk, Russia
Print_ISBN
5-7782-0662-3
Type
conf
DOI
10.1109/APEIE.2006.4292493
Filename
4292493
Link To Document