Title :
Recent advances in BIST
Author :
Gupta, Sandeep K.
Author_Institution :
Univ. of Southern California, Los Angeles, CA, USA
Abstract :
The author briefly reviews various recent results in data compression for BIST. His primary focus is on MISR compression, considering the practical design issues that interest a designer. Issues related to the choice of error model, feedback polynomial, and suitable test lengths are discussed.<>
Keywords :
built-in self test; data compression; errors; feedback; logic testing; polynomials; BIST; MISR compression; aliasing probability; data compression; error model; feedback polynomial; test lengths; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computational complexity; Contracts; Data compression; Error analysis; Linear feedback shift registers; Polynomials;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232758
