DocumentCode
3288906
Title
Recent advances in BIST
Author
Gupta, Sandeep K.
Author_Institution
Univ. of Southern California, Los Angeles, CA, USA
fYear
1992
fDate
7-9 April 1992
Firstpage
235
Lastpage
240
Abstract
The author briefly reviews various recent results in data compression for BIST. His primary focus is on MISR compression, considering the practical design issues that interest a designer. Issues related to the choice of error model, feedback polynomial, and suitable test lengths are discussed.<>
Keywords
built-in self test; data compression; errors; feedback; logic testing; polynomials; BIST; MISR compression; aliasing probability; data compression; error model; feedback polynomial; test lengths; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Computational complexity; Contracts; Data compression; Error analysis; Linear feedback shift registers; Polynomials;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-7803-0623-6
Type
conf
DOI
10.1109/VTEST.1992.232758
Filename
232758
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