Title :
Recent advances in sequential test generation
Author :
Cheng, Kwang-Ting
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Abstract :
The author gives a short review of recent developments in automatic test generation for sequential circuits. Approaches are classified according to the level of abstraction at which the circuit is described. The basic concepts, advantages, disadvantages, and application domains of representative methods of each class are discussed.<>
Keywords :
automatic testing; logic testing; sequential circuits; automatic test generation; sequential circuits; sequential test generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Design for testability; Logic; Sequential analysis; Sequential circuits; Taxonomy; Timing;
Conference_Titel :
VLSI Test Symposium, 1992. '10th Anniversary. Design, Test and Application: ASICs and Systems-on-a-Chip', Digest of Papers., 1992 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-7803-0623-6
DOI :
10.1109/VTEST.1992.232759
